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Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits

机译：虚拟探针：纳米级集成电路低成本硅表征的统计框架

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Wangyang Zhang; Student Member; Xin Li; Senior Member; Frank Liu; Emrah Acar; Rob A. Rutenbar; Ronald D. Blanton;
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1. Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits [J] . Zhang W., Li X., Liu F., Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on . 2011,第12期

机译：虚拟探针：纳米集成电路低成本硅表征的统计框架
2. Low-Voltage Driven P-Type Polycrystalline Silicon Thin-Film Transistor Integrated Gate Driver Circuits for Low-Cost Chip-on-Glass Panel [J] . Woo-Jin Nam, Hye-Jin Lee, Hee-Sun Shin, Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers . 2006,第5B期

机译：用于低成本玻璃板上芯片的低压驱动P型多晶硅薄膜晶体管集成栅极驱动器电路
3. 'Stress Tests' Probe Nanoscale Strains in Materials: New Results Will Impact the Design of Integrated Circuits [J] . M. D. Vaudin, Y. B. Gerbig, S. J. Stranick, Vakuum in Forschung und Praxis . 2008,第6Suppla期

机译：“应力测试”探查材料中的纳米级菌株：新结果将影响集成电路设计
4. Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits [C] . Li Xin, Rutenbar Rob R., Blanton Ronald D. Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009 . 2009

机译：虚拟探针：用于纳米级集成电路的最低成本硅表征的统计上最佳的框架
5. Low resistivity contact methodologies for silicon, silicon germanium and silicon carbon source/drain junctions of nanoscale CMOS integrated circuits. [D] . Alptekin, Emre. 2009

机译：用于纳米级CMOS集成电路的硅，硅锗和硅碳源极/漏极结的低电阻率接触方法。
6. Multi-array silicon probes with integrated optical fibers: light-assisted perturbation and recording of local neural circuits in the behaving animal [O] . Sébastien Royer, Boris V. Zemelman, Mladen Barbic, -1

机译：具有集成光纤的多阵硅探头：在行为动物中光辅助扰动和局部神经电路的记录
7. Hybrid integration of laser source on silicon photonic integrated circuit for low-cost interferometry medical device [O] . Matthieu Duperron, Lee Carroll, Marc Rensing, 2017

机译：低成本干涉测量医疗装置硅光子集成电路激光源的混合集成
8. Characterization of Silicon-Gate CMOS/SOS Integrated Circuits Processed with Ion Implantation [R] . Woo, D. S. 1982

机译：用离子注入处理的硅栅CmOs / sOs集成电路的表征

Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits

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